EIP-663 DUPN SWAPN EXCHANGE

Documentation for tests/osaka/eip7692_eof_v1/eip663_dupn_swapn_exchange@206854b5.

Generate fixtures for these test cases for Osaka with:

fill -v tests/osaka/eip7692_eof_v1/eip663_dupn_swapn_exchange --fork Osaka

Test cases for EIP-663: SWAPN, DUPN and EXCHANGE instructions

EIP-663 defines new stack manipulation instructions that allow accessing the stack at higher depths. Opcodes introduced: DUPN (0xE6), SWAPN (0xE7), EXCHANGEN (0xE8).